Join Thermo Fisher Scientific for a technical workshop focused on electron microscopy and advanced materials analysis.
The program features expert invited talks highlighting electron microscopy workflows in industry, with confirmed speakers from Canon Production Printing and Deon Research Centre.
Live instrument demonstrations will showcase automated site-specific crosssectioning and TEM lamella preparation using the Scios™ 3 DualBeam™, low-kV UHR imaging of beam-sensitive samples, and integrated DED-based EBSD revolutionizing crystallographic phase analysis with the Apreo™ ChemiSEM™, as well as fast, accessible benchtop microscopy with the Phenom™ XL, and additional advanced solutions.
This event is intended for industry researchers and engineers involved in materials development and characterization.
Why attend?
- Invited talks – Expert invited talks on electron microscopy and analytics featuring typical industrial EM workflows.
- Instrument demonstration – Live SEM, FIB, and TEM demonstrations highlighting research methodologies, industrial workflows and use cases.
- Technology update – Opportunities to interact with application scientists; insights into innovation and data analytics.
- Networking drinks – Open space for attendees to explore industry-based EM solutions, share experiences, and potentially collaborate.
Details
Location: De Schakel 2 5651 GH, Eindhoven, Netherlands
Date: 11th March 2026
Time: 9:00 – 16:30
Program overview
| 09:00 – 09:30 | Welcome and coffee |
| 09:30 – 09:45 | Workshop opening Thermo Fisher Scientific |
| 09:45 – 10:00 | Invited talk – SEM applications Deon Research Centre |
| 10:15 – 10:45 | Invited talk – SEM NLR (Dutch Aerospace Centre) |
| 10:45 – 11:00 | Coffee |
| 11:00 – 11:30 | Invited talk – TEM DLR (German Aerospace Centre) |
| 11:30 – 12:00 | Invited talk – FIB-SEM applications Canon Ink Systems |
| 12:00 – 12:30 | Semiconductor speaker slot |
| 13:30 – 16:00 | Demo 1 – Live integrated EDS and particle analysis on Axia ChemiSEM – Integrated EDS W-SEMDemo 2 – Low-voltage UHR imaging for beam-sensitive samples + integrated EBSD for crystallographic phase analysis on Apreo ChemiSEM – analytical FE-SEMDemo 3 – Automated cross-sectioning and lamella preparation on Scios 3 – Ga FIB-SEM with low-vacuum optionDemo 4 – Compact Desktop SEM for automated, routine, robust imaging and analysis on Phenom XL |
| 16:00 – 16:30 | Avizo – Multi-modal 2D/3D microscopy and spectroscopy analysis Thermo Fisher Scientific |
The event will be conducted in English.
Interested?
Attendance is free, but places are limited. Registration is required.
